EchoProbe SOFTWARE反射探针软件
setup of Recipes,Data logging,Real time Display
设置菜单,数据记录,实时显示
EchoProbe SOFTWARE反射探针软件
Programable Data Points and Patterns, Variety of Displays可控数据点,模式,显示种类
Presentation of Results结果陈列
Advantages of Optical EchoProbe光学反射探针优势
• Can measure Si or III/V wafers with or without tape, with Film frame, bumped wafers, bonded wafer - with Si or Glass or Sapphire carriers.可测量胶带及Si或者III/V裸硅片,带薄膜框架,凸起硅片,Si或者玻璃粘合硅片
• Not affected by tape thickness, adhesives, pattern structures or non conducting materials不受胶带厚度,粘合剂,图案结构或者不导电材料影响
• Non contact technique非接触技术
• Fast- measurement speed快速测量
• Extremely sensitive and stable method (demonstrated long term stability)极其灵敏和稳定的方法(长期稳定性已证实)
Conclusion总结
• Very experienced Metrology company with an array of industry proven tools for wafer thickness measurement.
• 经验丰富的测量技术公司,硅片测量设备已经被很多工业认可
• Provide measurement capability beyond Si, into III/V,and Quartz.测量技术涵盖Si, III/V,石英
• Provide a highly accurate Ultra-Thin wafer capability including 300 mm capability in a variety of platforms在一系列平台上,提供高精确度的超薄硅片测量能力包括300mm